By Richard H. Vollmerhausen
Advancing know-how in detector arrays, flat panel screens, and electronic snapshot processing offers new possibilities to extend imaging purposes and improve approach functionality. Technical managers and layout engineers are confronted with comparing the associated fee, weight, and function of an ever-expanding collection of know-how suggestions. This educational textual content presents the idea, methods, and knowledge essential to assessment and examine the functionality of obtainable imaging applied sciences. half I updates the sooner paintings awarded in Analysis of Sampled Imaging platforms (2000). half II discusses functionality overview of electro-optical imagers. half III offers machine courses (on a supplemental CD-ROM) and up to date info on detector arrays, optics, and reveal strategies.
The booklet covers a number of exhibit codecs and interfaces, and gives distinct details on to be had focal aircraft arrays (FPAs). specific emphasis is put on idea and perform for the wide range of obtainable infrared FPAs. applied sciences represented contain InSb, HgCdTe, QWIP, and uncooled thermal arrays. details is equipped at the quantum potency, blur, crosstalk, and noise features of every expertise. The detector and array dimensions of accessible FPAs are supplied. the data on optics, exhibit, and FPA subassemblies permits the version person to make speedy and life like functionality tests of electro-optical imager designs
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Additional info for Analysis and evaluation of sampled imaging systems
1 Thermal imagers This section provides suggestions for modeling a thermal objective lens. Diffraction-limited performance is sometimes a realistic assumption. The computer model allows the user to easily select other options. This section describes those options and their applicability. When designing thermal objectives, a number of factors must be considered. Producibility, weight, and volume are all important factors. Athermalization and performance over temperature extremes must be considered.
21(b) To generate the reconstructed waveform, all sinc waves are added together. The sum of the two sinc waves shown in Fig. 21(a) is shown here as the solid dark line. This example used only two samples. In the general case, sinc waves are generated for all samples, and the sum of all sinc waves is the reconstructed waveform. wave amplitude is equal to the sample value, and the period is such that the sinc wave crosses zero at all other sample points. The function f(x) is sampled over all space, and each sinc wave extends in both directions over all space.
0 per cycle. If the sample rate is just over two samples per cycle, an extended portion of the sine-wave function must be sampled and reconstructed in order to accurately replicate any one cycle. The following example illustrates this concept. 23 shows ten cycles of a sine wave. Fig. 24 is the Fourier transform of those ten cycles. Taking the first zero in Fig. 2 times per cycle. The asterisks in Fig. 23 show the sample points. 25 shows the result of sampling and reconstructing the sixth period near the middle.